TITLE: ATOMIC FORCE MICROSCOPY FILES ASSOCIATED TO FIGURE SI5.
This dataset is referred to the images acquired with the Atomic Force Microscopy employed in this work. This folder contains the original files obtained from the instrument before and after the scratching on glassy carbon based substrate.
Files with extension .ibw can be opened with open software Gwyddion and they contain all the recorded signals: Height, amplitude, phase and Zsensor.  
The folder also contains the picture, saved with .tif extension, obtained from the analysis of the two .ibw files and the measured average profile as txt files. Each of this file has two columns: one column is referred to the lenght considered and the other column is referred to the depth of the performed scratching.  
